Pekelsky, James R.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Testing and Metrology - Photometric Ordering Of Ordinary Moire Fringes

Pekelsky, James R., Xinhong, Ding, Grover, Chander P.

Year:

1986

Language:

english

File:

PDF, 11.00 MB

english, 1986

2

Automated Contour Ordering In Moire Topograms

Pekelsky, James R.

Journal:

Optical Engineering

Year:

1987

Language:

english

File:

PDF, 9.91 MB

english, 1987

3

SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Biostereometrics '85 - Automated Contour Ordering In Moird Topograms For Biostereometrics

Pekelsky, James R., Coblentz, A. M., Herron, Robin E.

Year:

1986

Language:

english

File:

PDF, 10.93 MB

english, 1986

4

SPIE Proceedings [SPIE 25th Annual Technical Symposium - San Diego (Monday 24 August 1981)] Airborne Reconnaissance V - Motion-Error Immunity In Photo Coordinate Determination-A Novel Approach To The Absolute Comparator

Pekelsky, James R., Bannach, Robert J.

Year:

1981

Language:

english

File:

PDF, 611 KB

english, 1981

5

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - Bootstrap calibration of an autocollimator, index table and sine bar ensemble for angle metrology

Pekelsky, James R., Decker, Jennifer E., Peng, Gwo-Sheng, Munro, Lorne E.

Year:

2005

Language:

english

File:

PDF, 854 KB

english, 2005

6

SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Two-part study toward lowest uncertainty calibration of ceramic gauge blocks: interferometry and mechanical comparison techniques

Decker, Jennifer E., Decker, Jennifer E., Brown, Nicholas, Ulrich, Anthony, LaPointe, Alain, Viliesid, Miguel, Pekelsky, James R.

Year:

2001

Language:

english

File:

PDF, 134 KB

english, 2001

7

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Recent Developments in Optical Gauge Block Metrology - Uncertainty of gauge block calibration by mechanical comparison: a worked example for gauge blocks of dissimilar materials

Decker, Jennifer E., Ulrich, Anthony, Pekelsky, James R., Decker, Jennifer E., Brown, Nicholas

Year:

1998

Language:

english

File:

PDF, 990 KB

english, 1998

8

A new instrument for the dimensional characterization of piston–cylinder units

Miles, John R, Munro, Lorne E, Pekelsky, James R

Journal:

Year:

2005

Language:

english

File:

PDF, 429 KB

english, 2005

9

Increasing the Range of Unambiguity in Step-Height Measurement with Multiple-Wavelength Interferometry-Application to Absolute Long Gauge Block Measurement

Decker, Jennifer E., Miles, John R., Madej, Alan A., Siemsen, Ralph F., Siemsen, Klaus J., Bonth, Sebastian de, Bustraan, Krijn, Temple, Sara, Pekelsky, James R.

Journal:

Year:

2003

Language:

english

File:

PDF, 318 KB

english, 2003

10

Practical magnetron sputtering system for the deposition of optical multilayer coatings

Dobrowolski, J. A., Pekelsky, James R., Pelletier, R., Ranger, M., Sullivan, Brian T., Waldorf, A. J.

Journal:

Year:

1992

Language:

english

File:

PDF, 822 KB

english, 1992

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски